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Proceedings Paper

Subnanosecond bulk damage thresholds of single-crystal YAG and diffusion-bonded YAG structures at 1 micron
Author(s): Robert D. Stultz; Karen E. Yokoyama; Jeanette Lurier; Michael Ushinsky; Robert W. Farley; Mark E. Rogers; Brendan J. Foran; Michael D. Thomas; Andrew J. Griffin
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Paper Abstract

Laser bulk damage thresholds were measured for both single-crystal YAG and for diffusion-bonded YAG structures using 600 picosecond pulses at 1064 nm. The tested samples included 3-layer sandwich structures with doped cores of various thicknesses. An undoped-YAG end cap was diffusion-bonded on one end of each of the sandwiches. The 1064 nm laser source was focused to a 13 micron diameter spot at the boundary region between the core and the undoped endcap. Measurements included the evaluation of single- and multiple-pulse damage thresholds at single sites, as well as thresholds for continuous 90%-overlap scans. The single-site thresholds at the diffusion-bonded boundary were close to that of single-crystal YAG. However, the continuous scans revealed isolated microscopic sites where the damage threshold was as much as 4 times lower than that of single-crystal YAG.

Paper Details

Date Published: 23 November 2011
PDF: 18 pages
Proc. SPIE 8190, Laser-Induced Damage in Optical Materials: 2011, 81900M (23 November 2011); doi: 10.1117/12.899148
Show Author Affiliations
Robert D. Stultz, Raytheon Space and Airborne Systems (United States)
Karen E. Yokoyama, Raytheon Space and Airborne Systems (United States)
Jeanette Lurier, Raytheon Space and Airborne Systems (United States)
Michael Ushinsky, Raytheon Space and Airborne Systems (United States)
Robert W. Farley, The Aerospace Corp. (United States)
Mark E. Rogers, The Aerospace Corp. (United States)
Brendan J. Foran, The Aerospace Corp. (United States)
Michael D. Thomas, Spica Technologies, Inc. (United Kingdom)
Andrew J. Griffin, Spica Technologies, Inc. (United Kingdom)


Published in SPIE Proceedings Vol. 8190:
Laser-Induced Damage in Optical Materials: 2011
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

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