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Proceedings Paper

Production of imagery-derived maps to aid the Japanese earthquake/tsunami relief effort
Author(s): David W. Messinger; Don McKeown; Nina Raqueño; Steve Cavilia; Chris DeAngelis; Sanjit Maitra; Weihua Sun
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Paper Abstract

On March 11, 2011, the magnitude 9 Tohoku earthquake and resulting tsunami struck off the coast of Japan. An estimated over 400,000 persons were displaced from their homes and the damage to the coastline and nearby urban areas was extensive. Additionally, the combined effects of the earthquake and tsunami caused damage to the Fukushima Dai'ichi Nuclear Power Station. As part of the International Charter "Space and Major Disasters", the US Geological Survey coordinated a volunteer effort to aid in the response to the disaster. The goal of the project was to produce maps derived from civilian (NASA Landsat and ASTER) and commercially available (DigitalGlobe and GeoEye), high resolution satellite imagery to be delivered to the Japanese authorities. RIT, as part of our Information Products Laboratory for Emergency Response (IPLER) program, was one of the organizations involved in this effort. This paper describes the timeline of the response, the challenges faced in this effort, the workflow developed, and the products that were distributed. Lessons learned from the response will also be described to aid the remote sensing community in preparing for responses to future natural disasters.

Paper Details

Date Published: 6 September 2011
PDF: 9 pages
Proc. SPIE 8158, Imaging Spectrometry XVI, 815802 (6 September 2011); doi: 10.1117/12.899069
Show Author Affiliations
David W. Messinger, Rochester Institute of Technology (United States)
Don McKeown, Rochester Institute of Technology (United States)
Nina Raqueño, Rochester Institute of Technology (United States)
Steve Cavilia, Rochester Institute of Technology (United States)
Chris DeAngelis, Rochester Institute of Technology (United States)
Sanjit Maitra, Rochester Institute of Technology (United States)
Weihua Sun, Rochester Institute of Technology (United States)

Published in SPIE Proceedings Vol. 8158:
Imaging Spectrometry XVI
Sylvia S. Shen; Paul E. Lewis, Editor(s)

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