Share Email Print

Proceedings Paper

Laser-induced damage thresholds of optical coatings at different temperature
Author(s): K. Mikami; S. Motokoshi; M. Fujita; T. Jitsuno; K. A. Tanaka
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Laser-induced damage thresholds for dielectric and metal single-layer coatings at different temperature conditions (123-473 K) were measured by 1064-nm wavelength and 4-ns pulses to elucidate the effects of initial temperature to laser damage mechanisms. SiO2, MgF2, gold, silver and copper single-layer coatings were prepared as experimental samples. In the experimental results, temperature dependence of LIDTs for optical substrates and all dielectric single-layer coatings indicated same trend as that for bulk silica glasses, which increased linearly with decreasing the temperature. However, all metallic coatings had the inverse trend of the dependence for dielectric coatings. The effects of initial temperature to laser damage mechanisms were considered with separated processes from the experimental results. In the conclusions, free-electron generation and electron multiple caused difficultly at low temperature and the laser-induced damage thresholds increased. On the other hand, plasma heating caused easily at low temperature and the laser-damage thresholds decreased.

Paper Details

Date Published: 22 November 2011
PDF: 7 pages
Proc. SPIE 8190, Laser-Induced Damage in Optical Materials: 2011, 81900A (22 November 2011); doi: 10.1117/12.899033
Show Author Affiliations
K. Mikami, Osaka Univ. (Japan)
S. Motokoshi, Institute for Laser Technology (Japan)
M. Fujita, Institute for Laser Technology (Japan)
T. Jitsuno, Osaka Univ. (Japan)
K. A. Tanaka, Osaka Univ. (Japan)

Published in SPIE Proceedings Vol. 8190:
Laser-Induced Damage in Optical Materials: 2011
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top