Share Email Print
cover

Proceedings Paper

Wavelength and temperature dispersion of refractive index of thin films
Author(s): Thomas M. Wood; Judikaël Le Rouzo; François R. Flory; Ludovic Escoubas; Paul Coudray
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The m-lines guided mode technique is demonstrated as a powerful tool for the measurement of wavelength and temperature refractive index dispersion in thin films. The proper treatment of results reveals measurement uncertainties of the order of 10-3 for the refractive index, and a sensitivity to changes in this quantity of the order 10-6. Furthermore, the thickness of the films can be established to a precision of 1nm. Using an optical stack consisting of a silicon wafer substrate, a low index buffer layer (index 1.52), topped with a polymer blend guiding film, The wavelength dispersion of the change of refractive index of the guiding film with temperature has been successfully measured. The temperature dispersion of the refractive index of the guiding layer is of ~ -6.7×10-5 /K.

Paper Details

Date Published: 30 September 2011
PDF: 7 pages
Proc. SPIE 8172, Optical Complex Systems: OCS11, 81720I (30 September 2011); doi: 10.1117/12.898524
Show Author Affiliations
Thomas M. Wood, Institut Matériaux Microélectronique Nanosciences de Provence, CNRS (France)
Judikaël Le Rouzo, Institut Matériaux Microélectronique Nanosciences de Provence, CNRS (France)
François R. Flory, Ecole Centrale Marseille (France)
Ludovic Escoubas, Institut Matériaux Microélectronique Nanosciences de Provence, CNRS (France)
Paul Coudray, Kloé SA, Montpellier (France)


Published in SPIE Proceedings Vol. 8172:
Optical Complex Systems: OCS11
Gérard Berginc, Editor(s)

© SPIE. Terms of Use
Back to Top