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Proceedings Paper

FSR: a field portable spectral reflectometer to measure ground from NIR to LWIR
Author(s): Louis Moreau; Hugo Bourque; Réal Ouellet; Florent Prel; Claude Roy; Christian Vallieres; Guillaume Thériault
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Paper Abstract

ABB Bomem has recently designed a field-deployable reflectometer. The Full Spectrum Reflectometer (FSR) measures the diffuse reflectance of surfaces in the 0.7 μm to 13.5 μm spectral range. The spectral resolution is adjustable from 32 to 4 cm-1. The instrument is portable, battery-operated and designed for field usage in a single, lightweight and ruggedized package. In its simplest mode, the instrument is automated and can be operated by non-specialist personnel with minimal training. The FSR has a laboratory mode to measure targets brought to the instrument in a sampling cup and a field mode with automated measurement sequence. To facilitate the measurement of various ground surfaces, the instrument is packaged in a three-point mount for easy target access and stability. One of the mount is the sampling port. The instrument has its own built-in NIR and LWIR infrared sources to illuminate the ground area to be measured. The instrument includes two built-in references for calibration: a Spectralon diffuser and an Infragold diffuser. The first units were commissioned to build a spectral database of surfaces in various conditions (humidity, temperature, texture, mixing, etc.) and in the presence of interfering chemicals (oils, solvents, etc.) but the instrument can also serve other purposes such as the identification of unknown materials.

Paper Details

Date Published: 28 September 2011
PDF: 10 pages
Proc. SPIE 8185, Electro-Optical and Infrared Systems: Technology and Applications VIII, 81850K (28 September 2011); doi: 10.1117/12.898319
Show Author Affiliations
Louis Moreau, ABB Bomem Inc. (Canada)
Hugo Bourque, ABB Bomem Inc. (Canada)
Réal Ouellet, ABB Bomem Inc. (Canada)
Florent Prel, ABB Bomem Inc. (Canada)
Claude Roy, ABB Bomem Inc. (Canada)
Christian Vallieres, ABB Bomem Inc. (Canada)
Guillaume Thériault, ABB Bomem Inc. (Canada)

Published in SPIE Proceedings Vol. 8185:
Electro-Optical and Infrared Systems: Technology and Applications VIII
David A. Huckridge; Reinhard R. Ebert, Editor(s)

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