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Proceedings Paper

Coatings masking in near, medium, and far infrared used for ship camouflage
Author(s): S. Milewski; R. Dulski; M. Kastek; P. Trzaskawka; J. Barela; K. Firmanty
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Paper Abstract

The increasing range of naval engagements results in development of camouflages applied on warships that mask their signatures first in visible and next in and IR spectra. Camouflage applied on warships that mask their IR signatures is one of the most basic countermeasure methods against attacks by heat-seeking missiles. A set of special coatings applied to the ship's hull allows misidentification by enemies weapon and so make the ship harder to destroy. Thus the knowledge on actual thermal contrast between the ship and surrounding background is required in order to provide an effective antimissile defense. The paper presents selected aspects related to ship's camouflage realized by altering its thermal signature as well as the results of radiometric measurement of thermal radiation of IR-masking coatings. Measurements were performed using IR imaging spectrometers in near, medium and far infrared spectra. The presented measurement results constitute the basis for the assessment of the effectiveness of IR masking methods and additionally provide the opportunity to effectively simulate the properties of masking coatings and further to optimize their radiometric properties in the infrared range.

Paper Details

Date Published: 28 September 2011
PDF: 10 pages
Proc. SPIE 8185, Electro-Optical and Infrared Systems: Technology and Applications VIII, 81850V (28 September 2011); doi: 10.1117/12.898293
Show Author Affiliations
S. Milewski, Polish Naval Academy (Poland)
R. Dulski, Military Univ. of Technology (Poland)
M. Kastek, Military Univ. of Technology (Poland)
P. Trzaskawka, Military Univ. of Technology (Poland)
J. Barela, Military Univ. of Technology (Poland)
K. Firmanty, Military Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 8185:
Electro-Optical and Infrared Systems: Technology and Applications VIII
David A. Huckridge; Reinhard R. Ebert, Editor(s)

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