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Proceedings Paper

On orbit performance of radio spectrometers of Superconducting Submillimeter-Wave Limb-Emission Sounder (JEM/SMILES)
Author(s): Hiroyuki Ozeki; Satoko Mizobuchi; Kenta Tamaki; Ken-ichi Kikuchi; Toshiyuki Nishibori; Satoshi Ochiai; Masato Shiotani; Chihiro Mitsuda
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Paper Abstract

On-orbit performance of the radio spectrometer of SMILES is discussed. We focused on the telemetry data of photodiode current, laser diode current, and laser diode operating temperature. The data showed degradation trend as the mission went on. This is due to a wear-out phenomenon of commercially available laser diode, which is used as the light source of the radio spectrometer. Since the laser diodes have a certain lifetime, both screening procedure and operating condition for them must be properly defined and implemented for ensuring a good performance of the spectrometer throughout designed mission life. For these purposes, we conducted several kinds of qualification tests including an accelerated life time test during design phase, and expected life time of the laser diode was derived on the basis of these test results. In this paper, the results from the qualification tests at ground and the actual performance on orbit with the telemetry and mission data will be presented.

Paper Details

Date Published: 3 October 2011
PDF: 10 pages
Proc. SPIE 8176, Sensors, Systems, and Next-Generation Satellites XV, 81760K (3 October 2011); doi: 10.1117/12.898018
Show Author Affiliations
Hiroyuki Ozeki, Toho Univ. (Japan)
Satoko Mizobuchi, Japan Aerospace Exploration Agency (Japan)
Kenta Tamaki, Toho Univ. (Japan)
Ken-ichi Kikuchi, National Institute of Information and Communications Technology (Japan)
Toshiyuki Nishibori, Japan Aerospace Exploration Agency (Japan)
Satoshi Ochiai, National Institute of Information and Communications Technology (Japan)
Masato Shiotani, Kyoto Univ. (Japan)
Chihiro Mitsuda, Fujitsu FIP Corp. (Japan)


Published in SPIE Proceedings Vol. 8176:
Sensors, Systems, and Next-Generation Satellites XV
Roland Meynart; Steven P. Neeck; Haruhisa Shimoda, Editor(s)

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