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Proceedings Paper

Supercontiuum laser-based instrument to measure hyperspectral polarized BRDF
Author(s): Romain Ceolato; Nicolas Rivière; Laurent Hespel; Beatrice Biscans
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Paper Abstract

Recent developments of active imaging and remote sensing systems in security and defence community require comprehensive optical characterizations of man-made targets. Optical signature analysis of various targets implies a better and comprehensive understanding of reflectance properties such as Bidirectional Reflectance Distribution Function (BRDF) and Directional Hemispherical Reflectance (DHR). Measurements and modeling of optical signatures are valuable for target classification and identification. Onera, the French Aerospace Lab, has developed an original optical instrument to measure hyperspectral polarized BRDF. Measurements are carried out on various targets to provide relevant data to simulate actual and future active imaging devices. This paper reviews the design of the instrument and its hyperspectral calibration procedure in details. A new specific tensorial hyperspectral reflectance framework is introduced. Experimental results for reference Lambertian targets and airport targets are presented to illustrate the instrument capacities. A large optical properties database is build from these measurements for defence, security and industrial needs.

Paper Details

Date Published: 20 October 2011
PDF: 12 pages
Proc. SPIE 8189, Optics and Photonics for Counterterrorism and Crime Fighting VII; Optical Materials in Defence Systems Technology VIII; and Quantum-Physics-based Information Security, 818913 (20 October 2011); doi: 10.1117/12.898004
Show Author Affiliations
Romain Ceolato, ONERA (France)
Nicolas Rivière, ONERA (France)
Laurent Hespel, ONERA (France)
Beatrice Biscans, Lab. de Genie Chimique, CNRS (France)


Published in SPIE Proceedings Vol. 8189:
Optics and Photonics for Counterterrorism and Crime Fighting VII; Optical Materials in Defence Systems Technology VIII; and Quantum-Physics-based Information Security
Roberto Zamboni; François Kajzar; Attila A. Szep; Mark T. Gruneisen; Miloslav Dusek; John G. Rarity; Colin Lewis; Douglas Burgess, Editor(s)

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