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Proceedings Paper

The top down design flow of a-Si:H photodiodes with multivariate methods of analysis
Author(s): Christian Merfort; Andreas Bablich; Oliver Schwaneberg; Krystian Watty; Markus Böhm
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Paper Abstract

A fast and reliable detection of potentially dangerous substances has become very important in ensuring civilian security. Currently, modern security systems have proven to be more effective on the basis that objects should be properly characterized and identified. For instance, chemical tests are used to identify samples of whitish powder that is suspected to be dangerous or illegal. Although these chemical tests are conducted very quickly, they are relatively expensive. However, well established methods of optical characterization offer a suitable alternative. The demand for low-cost and disposable devices have escalated the development of intelligent photodiodes, especially of tunable a-Si:H multispectral photodiodes1. Our aim of reengineering is to develop the best match for the spectral response adjustment. Unfortunately, it is not sufficient to optimize the spectral response only. The top down design flow begins with the calculation of the photocurrent for different combinations of light sources, spectral responses and whitish powder samples to build up a multivariate data set. The optimum combination is found at the point of intersection in the factor values in a 2-D scattergram. It is therefore, required that the use optimized photodiodes would simplify and accelerate the identification of potentially dangerous substances.

Paper Details

Date Published: 5 October 2011
PDF: 11 pages
Proc. SPIE 8186, Electro-Optical Remote Sensing, Photonic Technologies, and Applications V, 81860N (5 October 2011); doi: 10.1117/12.897374
Show Author Affiliations
Christian Merfort, Univ. Siegen (Germany)
Andreas Bablich, Univ. Siegen (Germany)
Oliver Schwaneberg, Bonn-Rhine-Sieg Univ. of Applied Sciences (Germany)
Krystian Watty, Univ. Siegen (Germany)
Markus Böhm, Univ. Siegen (Germany)


Published in SPIE Proceedings Vol. 8186:
Electro-Optical Remote Sensing, Photonic Technologies, and Applications V
Gary J. Bishop; Gary W. Kamerman; Ove Steinvall; John D. Gonglewski; Keith L. Lewis, Editor(s)

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