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Proceedings Paper

Study of the laser matter interaction in the femtosecond regime: application to the analysis of the laser damage of optical thin films
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Paper Abstract

We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.

Paper Details

Date Published: 5 October 2011
PDF: 10 pages
Proc. SPIE 8168, Advances in Optical Thin Films IV, 816815 (5 October 2011); doi: 10.1117/12.897372
Show Author Affiliations
B. Mangote, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
L. Gallais, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
M. Zerrad, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
M. Commandré, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
L. H. Gao, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
F. Lemarchand, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
M. Lequime, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
A. Melninkaitis, Vilnius Univ. (Lithuania)
J. Mirauskas, Vilnius Univ. (Lithuania)
V. Sirutkaitis, Vilnius Univ. (Lithuania)
S. Kicas, State Research Institute for Physical Sciences and Technology (Lithuania)
T. Tolenis, State Research Institute for Physical Sciences and Technology (Lithuania)
R. Drazdys, State Research Institute for Physical Sciences and Technology (Lithuania)
M. Mende, Laser Zentrum Hannover e.V. (Germany)
L. Jensen, Laser Zentrum Hannover e.V. (Germany)
H. Ehlers, Laser Zentrum Hannover e.V. (Germany)
D. Ristau, Laser Zentrum Hannover e.V. (Germany)
QUEST: Ctr. of Quantum Engineering and Space-Time Research (Germany)


Published in SPIE Proceedings Vol. 8168:
Advances in Optical Thin Films IV
Michel Lequime; H. Angus Macleod; Detlev Ristau, Editor(s)

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