Share Email Print
cover

Proceedings Paper

Resonances determination in microstructured films embedded in multilayered stacks
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Our approach consists in finding the eigenmodes and the complex eigenfrequencies of structures using a finite element method (FEM), that allows us to study mono- or bi-periodic gratings with a maximum versatility : complex shaped patterns, with anisotropic and graded index material, under oblique incidence and arbitrary polarization. In order to validate our method, we illustrate an example of a four layer dielectric slab, and compare the results with a specific method that we have called tetrachotomy, which gives us numerically the poles of the reflection coefficient (which corresponds to the eigenfrequencies of the structure). To illustrate our method, we show the eigenvalues of one- and two-dimensional gratings.

Paper Details

Date Published: 5 October 2011
PDF: 11 pages
Proc. SPIE 8168, Advances in Optical Thin Films IV, 816822 (5 October 2011); doi: 10.1117/12.897347
Show Author Affiliations
Benjamin Vial, Institut Fresnel, CNRS, Univ. Aix-Marseille III (France)
Silios Technologies (France)
Mireille Commandré, Institut Fresnel, CNRS, Univ. Aix-Marseille III (France)
Frédéric Zolla, Institut Fresnel, CNRS, Univ. Aix-Marseille III (France)
André Nicolet, Institut Fresnel, CNRS, Univ. Aix-Marseille III (France)
Stephane Tisserand, Silios Technologies (France)


Published in SPIE Proceedings Vol. 8168:
Advances in Optical Thin Films IV
Michel Lequime; H. Angus Macleod; Detlev Ristau, Editor(s)

© SPIE. Terms of Use
Back to Top