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Proceedings Paper

Research on an in-situ vision inspection system of the nick depth of easy open end
Author(s): Liu Huang; Yong-ming Xu; Ying-jun Zheng; Tian-tai Guo; Gui-ying Yu
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Paper Abstract

The size and shape of the nick of easy open end are key parameters in ensuring high packaging quality, but the present detection methods are still rather primitive. To solve this problem and realize automatic detection of easy open end in industrial production sites, an in-situ vision inspection system based on light-section principle is developed to measure the nick depth quickly and accurately, which utilizes self-developed image acquisition and processing software and uses an automatic blocking and threshold segmentation algorithm based on projection method. Experimental results show that the inspection system has realized the positioning accuracy of ±1mm in X and Y directions, and the depth of field in the system is 700μm. The vibration characteristics of the system is tested by using shaking table with vibration frequency of 6.7Hz and amplitude of 360μm to simulate production environment of easy open end, which verifies that the system can work in similar production environments.

Paper Details

Date Published: 8 September 2011
PDF: 8 pages
Proc. SPIE 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, 819109 (8 September 2011); doi: 10.1117/12.897098
Show Author Affiliations
Liu Huang, China Jiliang Univ. (China)
Yong-ming Xu, Hangzhou Future Optics Sci. & Tech. Co., Ltd. (China)
Ying-jun Zheng, China Jiliang Univ. (China)
Tian-tai Guo, China Jiliang Univ. (China)
Gui-ying Yu, China Jiliang Univ. (China)


Published in SPIE Proceedings Vol. 8191:
International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies
Yuelin Wang; Huikai Xie; Yufeng Jin, Editor(s)

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