Share Email Print
cover

Proceedings Paper

Comparison of SEM and optical analysis of DT neutron tracks in CR-39 detectors
Author(s): P. A. Mosier-Boss; L. P. G. Forsley; P. Carbonnelle; M. S. Morey; J. R. Tinsley; J. P. Hurley; F. E. Gordon
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

CR-39 detectors were exposed to DT neutrons generated by a Thermo Fisher model A290 neutron generator. Afterwards, the etched tracks were examined both optically and by scanning electron microscopy (SEM). The purpose of the analysis was to compare the two techniques and to determine whether additional information on track geometry could be obtained by SEM analysis. The use of these techniques to examine triple tracks, diagnostic of ≥9.6 MeV neutrons, observed in CR-39 used in Pd/D co-deposition experiments will also be discussed.

Paper Details

Date Published: 28 September 2011
PDF: 8 pages
Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 81420K (28 September 2011); doi: 10.1117/12.896953
Show Author Affiliations
P. A. Mosier-Boss, SPAWAR Systems Ctr. Pacific (United States)
L. P. G. Forsley, JWK International Corp. (United States)
P. Carbonnelle, Univ. Catholique de Louvain (Belgium)
M. S. Morey, National Security Technologies, LLC (United States)
J. R. Tinsley, National Security Technologies, LLC (United States)
J. P. Hurley, National Security Technologies, LLC (United States)
F. E. Gordon, SPAWAR Systems Ctr. Pacific (United States)


Published in SPIE Proceedings Vol. 8142:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
Larry A. Franks; Ralph B. James; Arnold Burger, Editor(s)

© SPIE. Terms of Use
Back to Top