Proceedings Paper
Mapping the x-ray response of a CdTe sensor with small pixels using an x-ray microbeam and a single photon processing readout chip| Format | Member Price | Non-Member Price |
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Paper Abstract
CdTe is a promising material for X-ray imaging since it has high stopping power for X-rays. However defects in the
material, non ideal charge transport and long range X-ray fluorescence deteriorates the image quality. We have
investigated the response of a CdTe sensor with very small pixels using an X-ray microbeam entering the sensor at a
small incident angle. Effects of defects as well as depth of interaction can be measured by this method. Both electron and
hole collection mode has been tested. The results show distorted electrical field around defects in the material and also
shows the small pixel effect. It is also shown that charge summing can be used to get correct spectral information.
Paper Details
Date Published: 23 September 2011
PDF: 10 pages
Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 814208 (23 September 2011); doi: 10.1117/12.896796
Published in SPIE Proceedings Vol. 8142:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
Larry A. Franks; Ralph B. James; Arnold Burger, Editor(s)
PDF: 10 pages
Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 814208 (23 September 2011); doi: 10.1117/12.896796
Show Author Affiliations
Erik Frojdh, Mid Sweden Univ. (Sweden)
Christer Frojdh, Mid Sweden Univ. (Sweden)
Christer Frojdh, Mid Sweden Univ. (Sweden)
Borje Norlin, Mid Sweden Univ. (Sweden)
Goran Thungstrom, Mid Sweden Univ. (Sweden)
Goran Thungstrom, Mid Sweden Univ. (Sweden)
Published in SPIE Proceedings Vol. 8142:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
Larry A. Franks; Ralph B. James; Arnold Burger, Editor(s)
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