CdTe is a promising material for X-ray imaging since it has high stopping power for X-rays. However defects in the material, non ideal charge transport and long range X-ray fluorescence deteriorates the image quality. We have investigated the response of a CdTe sensor with very small pixels using an X-ray microbeam entering the sensor at a small incident angle. Effects of defects as well as depth of interaction can be measured by this method. Both electron and hole collection mode has been tested. The results show distorted electrical field around defects in the material and also shows the small pixel effect. It is also shown that charge summing can be used to get correct spectral information.

Date Published: 23 September 2011
PDF: 10 pages
Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 814208 (23 September 2011); doi: 10.1117/12.896796

Published in SPIE Proceedings Vol. 8142:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
Larry A. Franks; Ralph B. James; Arnold Burger, Editor(s)