Share Email Print

Proceedings Paper

Multimodal scattering facilities and modelization tools for a comprehensive investigation of optical coatings
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Losses due to the scattered light are known to be a key limitation of optical components performances. Hence a challenge consists in identifying and quantifying the scattering sources with high accuracy. In this context, dedicated techniques and facilities were developed at Institut Fresnel. Numerical and metrological platforms dedicated to light scattering characterization and modelization were created and are be presented in this paper.

Paper Details

Date Published: 30 September 2011
PDF: 13 pages
Proc. SPIE 8169, Optical Fabrication, Testing, and Metrology IV, 81690K (30 September 2011); doi: 10.1117/12.896730
Show Author Affiliations
Myriam Zerrad, Institut Fresnel, CNRS (France)
Michel Lequime, Institut Fresnel, CNRS (France)
Claude Amra, Institut Fresnel, CNRS (France)

Published in SPIE Proceedings Vol. 8169:
Optical Fabrication, Testing, and Metrology IV
Angela Duparré; Roland Geyl, Editor(s)

© SPIE. Terms of Use
Back to Top