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Proceedings Paper

Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)
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Paper Abstract

Imaging Fourier Transform Spectrometer working in the far UV (IFTSUV) may be the technical solution to answer many unsolved problems concerning the physics of the solar outer atmosphere. The VUV domain highly constrains the instruments design and performances as it demands a high optics surface quality and an accurate metrology to preserve IFTSUV spectral precision and Signal to Noise Ratio (SNR). We present the advancements on the specification of a metrology system, meeting the predicted performance requirements of an IFTSUV.

Paper Details

Date Published: 21 September 2011
PDF: 9 pages
Proc. SPIE 8169, Optical Fabrication, Testing, and Metrology IV, 816907 (21 September 2011); doi: 10.1117/12.896714
Show Author Affiliations
C. Ruiz de Galarreta Fanjul, Institut d'Astrophysique Spatiale (France)
A. Philippon, Institut d'Astrophysique Spatiale (France)
J.-C. Vial, Institut d'Astrophysique Spatiale (France)
J.-P. Maillard, Institut d'Astrophysique de Paris (France)
T. Appourchaux, Institut d'Astrophysique Spatiale (France)


Published in SPIE Proceedings Vol. 8169:
Optical Fabrication, Testing, and Metrology IV
Angela Duparré; Roland Geyl, Editor(s)

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