Share Email Print
cover

Proceedings Paper

In-process testing for cryo-figuring 1.5 meter diameter auto-collimating flats
Author(s): David J. Fischer; Joseph Hayden; James K. Lawton; Brandon Olson; Chris Brophy; Scott Kennard
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Three auto-collimating flats (ACFs) of 1.5 meter clear aperture are being manufactured for use in the JSC Cryo-Optical Metrology test of the James Webb Space Telescope. In-process interferometric testing of the ACFs is used to guide their surface-figure processing. The surface measurement is performed in a vacuum chamber at both room (+20 °C) and cryogenic (-240 °C) temperatures. With a 12-inch beam diameter FizCam interferometer, sub-aperture measurements are taken across the ACF diameter at multiple rotations. These measurements are stitched together to compute the surface figure. The figure change between room-temperature and cryogenic temperature is measured and used to enable cryo-figuring based on room-temperature measurements. The data analysis is calibrated to account for gravity sag on test-set optics and surface aberrations caused by vacuum pressure and temperature gradients on vacuum-chamber windows. The first ACF is complete and meets specification with surface error of less than 75 nm RMS.

Paper Details

Date Published: 15 September 2011
PDF: 11 pages
Proc. SPIE 8146, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts V, 81460A (15 September 2011); doi: 10.1117/12.896355
Show Author Affiliations
David J. Fischer, ITT Corp. Geospatial Systems (United States)
Joseph Hayden, Sigma Space Corp., NASA Goddard Space Flight Ctr. (United States)
James K. Lawton, JKLawton MATLAB Consultant (United States)
Brandon Olson, ITT Corp. Geospatial Systems (United States)
Chris Brophy, ITT Corp. Geospatial Systems (United States)
Scott Kennard, ITT Corp. Geospatial Systems (United States)


Published in SPIE Proceedings Vol. 8146:
UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts V
Howard A. MacEwen; James B. Breckinridge, Editor(s)

© SPIE. Terms of Use
Back to Top