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Proceedings Paper

Growth, characterization and fabrication of thick detectors from as-grown Cd0.9Zn0.1Te:In by traveling heater method
Author(s): U. N. Roy; S. Weiler; J. Stein; M. Groza; Y. Cui; V. Buliga; A. Burger
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Paper Abstract

CdZnTe, commonly known as CZT is the material of paramount importance for hard X-ray and gamma ray spectroscopy and imaging applications at room temperature. Over the years, the quality of CZT crystals and its charge transport properties has improved significantly making it an attractive detector material especially for homeland security applications. The applications for homeland security demand large and thick detectors to provide a sufficient stopping power for fast detection of high energy gamma photons. In this present report we have grown two inch diameter CZT by Traveling heater method (THM) technique. The as-grown crystals were characterized through photoluminescence (PL) mapping for composition uniformity, growth interface study, Te precipitations/inclusions studies. In order to evaluate our as-grown samples, charge transport characteristics have been studied for thick samples up to ~16mm thick. It has been demonstrated that by controlling the growth interface, visualization of large and thick (~16mm thick) detectors with fairly good response is possible from as-grown CZT detectors grown by THM technique.

Paper Details

Date Published: 27 September 2011
PDF: 7 pages
Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 814215 (27 September 2011); doi: 10.1117/12.896351
Show Author Affiliations
U. N. Roy, FLIR Radiation Inc. (United States)
S. Weiler, FLIR Radiation Inc. (United States)
J. Stein, FLIR Radiation Inc. (United States)
M. Groza, Fisk Univ. (United States)
Y. Cui, Fisk Univ. (United States)
V. Buliga, Fisk Univ. (United States)
A. Burger, Fisk Univ. (United States)
Vanderbilt Univ. (United States)

Published in SPIE Proceedings Vol. 8142:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
Larry A. Franks; Ralph B. James; Arnold Burger, Editor(s)

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