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Proceedings Paper

Thickness uniformity improvement for the twin mirrors used in advanced gravitational wave detectors
Author(s): B. Sassolas; Q. Benoît; R. Flaminio; D. Forest; J. Franc; M. Galimberti; A. Lacoudre; C. Michel; J.-L. Montorio; N. Morgado; L. Pinard
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Paper Abstract

Gravitational wave detectors such as Virgo and LIGO use long-baseline Michelson interferometers with high finesse Fabry-Perrot cavity in the arms. The symmetry of these cavities is essential to prevent the interferometer from sensitivity to laser fluctuations. For this purpose the difference between the transmissions of the two input mirrors has to be minimized. Advanced LIGO, the upgrade of LIGO, plans a transmission matching between the two input mirrors as high as 99%. A small deviation in the process fabrication from run to run might induce transmission mismatch larger than 1%. Consequently, the two input mirrors have to be coated during the same coating run. That requires ability to deposit the reflective coating, based on a stack of titanium doped tantala (Ti:Ta2O5) layers and silica layers, uniformly over a 800 mm diameter aperture. This paper presents the study to improve the thickness uniformity of a reflective coating and the preliminary results achieved on two Ø350mm substrates coated in the run.

Paper Details

Date Published: 4 October 2011
PDF: 8 pages
Proc. SPIE 8168, Advances in Optical Thin Films IV, 81681Q (4 October 2011); doi: 10.1117/12.896318
Show Author Affiliations
B. Sassolas, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
Q. Benoît, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
R. Flaminio, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
D. Forest, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
J. Franc, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
M. Galimberti, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
A. Lacoudre, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
C. Michel, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
J.-L. Montorio, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
N. Morgado, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)
L. Pinard, Lab. des Matériaux Avancés, CNRS, Univ. Paris-Est Créteil (France)


Published in SPIE Proceedings Vol. 8168:
Advances in Optical Thin Films IV
Michel Lequime; H. Angus Macleod; Detlev Ristau, Editor(s)

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