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Proceedings Paper

A component inspection algorithm based on low-dimensional image feature
Author(s): Jianjie Wu; Yuhui Zhang
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Paper Abstract

The images captured by image-array-based automatic optical inspection devices may be inconsistent in lightness, definition and uniformity, which greatly influence the accuracy of the inspection result. To solve such a problem, a component inspection algorithm based on low-dimensional image feature is proposed. It doesn't compare inspected image with standard image from pixel to pixel like traditional algorithms do. Instead it compares key image feature extracted from the image by designing feature functions and computing attributes. The essential of the algorithm is to transfer the original high-dimensional information contained within the image to one-dimensional feature data. Experiments show that the algorithm can ensure efficient and low-storage real-time component inspection.

Paper Details

Date Published: 8 July 2011
PDF: 6 pages
Proc. SPIE 8009, Third International Conference on Digital Image Processing (ICDIP 2011), 80092Z (8 July 2011); doi: 10.1117/12.896272
Show Author Affiliations
Jianjie Wu, Huazhong Univ. of Science and Technology (China)
Yuhui Zhang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8009:
Third International Conference on Digital Image Processing (ICDIP 2011)
Ting Zhang, Editor(s)

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