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Proceedings Paper

The use of EM-CCDs on high resolution soft x-ray spectrometers
Author(s): James H. Tutt; Andrew D. Holland; Neil J. Murray; Richard D. Harriss; David J. Hall; Matt Soman; Randall L. McEntaffer; James Endicott
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Paper Abstract

Charge-Coupled Devices (CCDs) have been traditionally used on high resolution soft X-ray spectrometers, but with their ability to increase the signal level in the detector before the readout noise of the system is added, Electron-Multiplying CCDs (EM-CCDs) have the potential to offer many advantages in soft X-ray detection. Through this signal multiplication an EM-CCD has advantages over conventioanl CCDs of increased signal, suppressed noise, faster readout speeds for the same equivalent readout noise and an increased inmmunity to Electro-Magnetic Intereference. This paper will look at present and future spacel applications for high resolution soft X-ray spectrometers and assess the advantages and disadvantage of using EM-CCDs in these applications.

Paper Details

Date Published: 14 September 2011
PDF: 12 pages
Proc. SPIE 8145, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII, 81450L (14 September 2011); doi: 10.1117/12.895981
Show Author Affiliations
James H. Tutt, The Open Univ. (United Kingdom)
Andrew D. Holland, The Open Univ. (United Kingdom)
Neil J. Murray, The Open Univ. (United Kingdom)
Richard D. Harriss, The Open Univ. (United Kingdom)
David J. Hall, The Open Univ. (United Kingdom)
Matt Soman, The Open Univ. (United Kingdom)
Randall L. McEntaffer, The Univ. of Iowa (United States)
James Endicott, e2v Technologies (United Kingdom)


Published in SPIE Proceedings Vol. 8145:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII
Oswald H. Siegmund, Editor(s)

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