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Proceedings Paper

X-ray optics shape error evaluation: synergy between innovative shape metrology and the TraceIT 3D ray-tracing
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Paper Abstract

This paper present the advance in X-ray optics performances prediction achieved by means of a advantageous synergy between the TraceIT ray-tracing code, capable to take into account the mirror shells shape error, and an opportune mirror shells 3D metrology. The trend for future X-ray missions is to make use of optical modules working in grazing incidence whose mirror shells are characterized by large diameters and small thickness. The floppiness of these mirrors induces noticeable shape errors and a consequent degradation of the optical quality. It is hence crucial to have a simulation tool capable to evaluate these errors impact on the mirror optical quality at the focal plane and, of course, a metrological machine capable to characterize the shell 3D shape. The synergy between these two contributions, accurate 3D mirror shells metrology and TraceIT ray-tracing, offers us the possibility to simulate the quality of an optical surface within an uncertainty of 1 arcsec. This work shows the TraceIT code structure and its advantages, a brief description of the adopted metrological machine and an example of their synergised applications: the evaluation of the optical quality of a prototypal mirror shell and an estimation of the committed in this evaluation caused by the metrological error.

Paper Details

Date Published: 23 September 2011
PDF: 7 pages
Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 81410P (23 September 2011); doi: 10.1117/12.895975
Show Author Affiliations
G. Sironi, INAF - Brera Astronomical Observatory (Italy)
O. Citterio, INAF - Brera Astronomical Observatory (Italy)
G. Pareschi, INAF - Brera Astronomical Observatory (Italy)

Published in SPIE Proceedings Vol. 8141:
Advances in Computational Methods for X-Ray Optics II
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)

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