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Proceedings Paper

Development of multi-beam long trace profiler
Author(s): Kiranmayee Kilaru; Daniel J. Merthe; Zulfiqar Ali; Mikhail V. Gubarev; Thomas Kester; Carl M. Benson; Wayne R. Mckinney; Peter Z. Takacs; Valeriy V. Yashchuk
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Paper Abstract

In order to fulfill the angular resolution requirements and make the performance goals for future NASA missions feasible, it is crucial to develop instruments capable of fast and precise figure metrology of x-ray optical elements for further correction of the surface errors. The Long Trace Profilometer (LTP) is an instrument widely used for measuring the surface figure of grazing incidence X-ray mirrors. In the case of replicated optics designed for x-ray astronomy applications, such as mirrors and the corresponding mandrels have a cylindrical shape and their tangential profile is parabolic or hyperbolic. Modern LTPs have sub-micro radian accuracy, but the measuring speed is very low, because the profilometer measures surface figure point by point using a single laser beam. The measurement rate can be significantly improved by replacing the single optical beam with multiple beams. The goal of this study is to demonstrate the viability of multi-beam metrology as a way of significantly improving the quality and affordability of replicated x-ray optics. The multi-beam LTP would allow one- and two-dimensional scanning with sub-micro radian resolution and a measurement rate of about ten times faster compared to the current LTP. The design details of the instrument's optical layout and the status of optical tests will be presented.

Paper Details

Date Published: 12 October 2011
PDF: 8 pages
Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 814719 (12 October 2011); doi: 10.1117/12.895532
Show Author Affiliations
Kiranmayee Kilaru, NASA Marshall Space Flight Ctr. (United States)
Daniel J. Merthe, Lawrence Berkeley National Lab. (United States)
Zulfiqar Ali, Lawrence Berkeley National Lab. (United States)
Mikhail V. Gubarev, NASA Marshall Space Flight Ctr. (United States)
Thomas Kester, NASA Marshall Space Flight Ctr. (United States)
Carl M. Benson, NASA Marshall Space Flight Ctr. (United States)
Wayne R. Mckinney, Lawrence Berkeley National Lab. (United States)
Peter Z. Takacs, Brookhaven National Lab. (United States)
Valeriy V. Yashchuk, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 8147:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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