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Proceedings Paper

Design of the IXO optics based on thin glass plates connected by reinforcing ribs
Author(s): G. Parodi; F. Martelli; S. Basso; O. Citterio; M. Civitani; P. Conconi; M. Ghigo; G. Pareschi; A. Zambra
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Paper Abstract

Effective area requirements for the large X-ray mirror of the International X-ray Observatory (IXO) are about 3 m2 at 1keV, 0.65 m2 at 6 keV and 150 cm2 at 30 keV. Because of its large dimension, the telescope cannot be realized as a monolithic structure but rather it requires the integration and assembly in the telescope optical bench of a number of basic module units, called X-ray Optical Unit (XOU). We are currently studying a method for the production of these basic units that is based on the slumping technology for the production of thin glass segmented mirrors. It foresees the implementation of a stacking integration concept based on the use of reinforcing ribs connecting the glass segments in order to create very stiff structures. This paper reports on the last design of the single optical module and describe the results of FEM analyses that show how it is possible to use an innovative approach to the integration of the slumped glass foils.

Paper Details

Date Published: 6 October 2011
PDF: 12 pages
Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 81470Q (6 October 2011); doi: 10.1117/12.895397
Show Author Affiliations
G. Parodi, BCV Progetti S.r.l. (Italy)
F. Martelli, BCV Progetti S.r.l. (Italy)
S. Basso, INAF - Osservatorio Astronomico di Brera (Italy)
O. Citterio, INAF - Osservatorio Astronomico di Brera (Italy)
M. Civitani, INAF - Osservatorio Astronomico di Brera (Italy)
Univ. degli Studi dell'Insubria (Italy)
P. Conconi, INAF - Osservatorio Astronomico di Brera (Italy)
M. Ghigo, INAF - Osservatorio Astronomico di Brera (Italy)
G. Pareschi, INAF - Osservatorio Astronomico di Brera (Italy)
A. Zambra, INAF - Osservatorio Astronomico di Brera (Italy)


Published in SPIE Proceedings Vol. 8147:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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