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Proceedings Paper

Singular beams in metrology and nanotechnology
Author(s): Joseph Shamir
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Paper Abstract

Optical singularities are localized regions in a light field where one or more of the field parameters, such as phase or polarization, become singular with associated zero intensity. Focused to a small spot, the electromagnetic field around the singularity has interesting characteristics, in particular when it interacts with matter. The light scattered by a material object within the strongly varying optical field around the singularity is extremely sensitive to changes and can be exploited for metrology with high sensitivity and the study of physical processes on a nanometer scale.

Paper Details

Date Published: 20 September 2011
PDF: 8 pages
Proc. SPIE 8122, Tribute to Joseph W. Goodman, 81220H (20 September 2011); doi: 10.1117/12.895130
Show Author Affiliations
Joseph Shamir, Technion-Israel Institute of Technology (Israel)

Published in SPIE Proceedings Vol. 8122:
Tribute to Joseph W. Goodman
H. John Caulfield; Henri H. Arsenault, Editor(s)

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