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Proceedings Paper

Measurements of aberrations of aspherical lenses using experimental ray tracing
Author(s): Ufuk Ceyhan; Thomas Henning; Friedrich Fleischmann; David Hilbig; Dietmar Knipp
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Paper Abstract

An experimental ray tracer for measuring the optical aberrations of aspherical lenses is presented. Setup is based on the principle of ray tracing which is used in optical design for virtually tracing rays through an optical system. This method has the potential to be used in aspherical lens testing because of its flexibility and high dynamic range. Wavefront aberrations can be calculated from results of experimental ray tracing. Furthermore the method offers the possibility of retrieval of aspherical surface profiles. Preliminary results with a plano-convex aspherical lens are compared with those obtained by a commercial surface profiler.

Paper Details

Date Published: 27 May 2011
PDF: 8 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821K (27 May 2011); doi: 10.1117/12.895009
Show Author Affiliations
Ufuk Ceyhan, Univ. of Applied Sciences Bremen (Germany)
Thomas Henning, Univ. of Applied Sciences Bremen (Germany)
Friedrich Fleischmann, Univ. of Applied Sciences Bremen (Germany)
David Hilbig, Univ. of Applied Sciences Bremen (Germany)
Dietmar Knipp, Jacobs Univ. (Germany)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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