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Proceedings Paper

Performance degradation of grid-tied photovoltaic modules in a hot-dry climatic condition
Author(s): Adam Suleske; Jaspreet Singh; Joseph Kuitche; Govindasamy Tamizh-Mani
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Paper Abstract

The crystalline silicon photovoltaic (PV) modules under open circuit conditions typically degrade at a rate of about 0.5% per year. However, it is suspected that the modules in an array level may degrade, depending on equipment/frame grounding and array grounding, at higher rates because of higher string voltage and increased module mismatch over the years of operation in the field. This paper compares and analyzes the degradation rates of grid-tied photovoltaic modules operating over 10-17 years in a desert climatic condition of Arizona. The nameplate open-circuit voltages of the arrays ranged between 400 and 450 V. Six different types/models of crystalline silicon modules with glass/glass and glass/polymer constructions were evaluated. About 1865 modules were inspected using an extended visual inspection checklist and infrared (IR) scanning. The visual inspection checklist included encapsulant discoloration, cell/interconnect cracks, delamination and corrosion. Based on the visual inspection and IR studies, a large fraction of these modules were identified as allegedly healthy and unhealthy modules and they were electrically isolated from the system for currentvoltage (I-V) measurements of individual modules. The annual degradation rate for each module type is determined based on the I-V measurements.

Paper Details

Date Published: 13 September 2011
PDF: 7 pages
Proc. SPIE 8112, Reliability of Photovoltaic Cells, Modules, Components, and Systems IV, 81120P (13 September 2011); doi: 10.1117/12.894928
Show Author Affiliations
Adam Suleske, Arizona State Univ. (United States)
Jaspreet Singh, Arizona State Univ. (United States)
Joseph Kuitche, Arizona State Univ. (United States)
Govindasamy Tamizh-Mani, Arizona State Univ. (United States)

Published in SPIE Proceedings Vol. 8112:
Reliability of Photovoltaic Cells, Modules, Components, and Systems IV
Neelkanth G. Dhere; John H. Wohlgemuth; Kevin W. Lynn, Editor(s)

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