Share Email Print
cover

Proceedings Paper

Open-source data analysis and visualization software platform: SAGUARO
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical engineering projects often require massive data processing with many steps in the course of design, simulation, fabrication, metrology, and evaluation. A MATLAB™-based data processing platform has been developed to provide a standard way to manipulate and visualize various types of data that are created from optical measurement equipment. The operation of this software platform via a graphical user interface is easy and powerful. Data processing is performed by running modules that use a proscribed format for sharing data. Complex operations are performed by stringing modules together using macros. While numerous modules have been developed to allow data processing without the need to write software, the greatest power of the platform is provided by its flexibility. A developer's toolkit is provided to allow development and customization of modules, and the program allows a real-time interface with the standard MATLAB environment. This software, developed by the Large Optics Fabrication and Testing group at the University of Arizona, is now publicly available.** We present the capabilities of the software and provide some demonstrations of its use for data analysis and visualization. Furthermore, we demonstrate the flexibility of the platform for solving new problems.

Paper Details

Date Published: 26 September 2011
PDF: 10 pages
Proc. SPIE 8126, Optical Manufacturing and Testing IX, 81260B (26 September 2011); doi: 10.1117/12.894908
Show Author Affiliations
Dae Wook Kim, College of Optical Sciences, The Univ. of Arizona (United States)
Benjamin J. Lewis, College of Optical Sciences, The Univ. of Arizona (United States)
James H. Burge, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 8126:
Optical Manufacturing and Testing IX
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)

© SPIE. Terms of Use
Back to Top