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Proceedings Paper

Luminescence decay times of PdOEP:PVK OLEDs fabricated in controlled O2 and H2O environments
Author(s): Weipan Cui; Rui Liu; Alex Smith; Joseph Shinar; Ruth Shinar
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Paper Abstract

Residual levels of O2 in OLEDs and their relation to device performance were evaluated by measuring (i) the photoluminescence (PL) decay time (following pulsed UV LED excitation) of the O2 sensing dye Pd octaethylporphyrin (PdOEP) doped in the active OLED layer poly(N-vinyl carbazole) (PVK) and (ii) the electroluminescence (EL) decay time (following a bias pulse) of glass/ITO/PEDOT:PSS/6 wt.% PdOEP:PVK/CsF/Al OLEDs. The active layer was prepared under various conditions of exposure to controlled O2 levels and relative humidity. PdOEP was used successfully for monitoring exposure of PdOEP:PVK to low levels of oxygen and shortened device PL decay times often indicated device deterioration. The PL decay time at various applied voltages and the EL decay time at various current densities were monitored to evaluate degradation processes related to oxygen and other bimolecular quenching phenomena.

Paper Details

Date Published: 16 September 2011
PDF: 7 pages
Proc. SPIE 8118, Organic Semiconductors in Sensors and Bioelectronics IV, 81180V (16 September 2011); doi: 10.1117/12.894709
Show Author Affiliations
Weipan Cui, Ames Lab. (United States)
Iowa State Univ. (United States)
Rui Liu, Ames Lab. (United States)
Alex Smith, Iowa State Univ. (United States)
Joseph Shinar, Ames Lab. (United States)
Iowa State Univ. (United States)
Ruth Shinar, Iowa State Univ. (United States)

Published in SPIE Proceedings Vol. 8118:
Organic Semiconductors in Sensors and Bioelectronics IV
Ruth Shinar; Ioannis Kymissis, Editor(s)

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