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Proceedings Paper

Spatial coherence studies on x-ray multilayers
Author(s): Ch. Morawe; R. Barrett; K. Friedrich; R. Klünder; A. Vivo
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Paper Abstract

The degree of coherence preservation of x-ray multilayers was investigated using Talbot imaging on the ESRF undulator beamline ID06. Several W/B4C multilayer mirrors with differing d-spacings were studied with monochromatic light at various photon energies. To understand the respective influence of the underlying substrate and the multilayer coatings, measurements were made under total reflection, at different Bragg peaks, and on the bare substrates. In addition, samples with different substrate quality were compared. The relation between spatial coherence preservation and the visibility of characteristic line structures in the x-ray beam will be discussed.

Paper Details

Date Published: 28 September 2011
PDF: 14 pages
Proc. SPIE 8139, Advances in X-Ray/EUV Optics and Components VI, 813909 (28 September 2011); doi: 10.1117/12.894617
Show Author Affiliations
Ch. Morawe, European Synchrotron Radiation Facility (France)
R. Barrett, European Synchrotron Radiation Facility (France)
K. Friedrich, European Synchrotron Radiation Facility (France)
R. Klünder, European Synchrotron Radiation Facility (France)
A. Vivo, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 8139:
Advances in X-Ray/EUV Optics and Components VI
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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