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Proceedings Paper

Novel optical refraction index sensor
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Paper Abstract

This works describes a novel optical refraction index sensor which is based on the analysis of double reflection lecture detection. This process initially identifies the thickness of a semitransparent solid o liquid material by the retro-reflection of a laser diode at 633nm as a function of distance along the device under test with a Z-axis scanner to find the focusing point. This feedback signal brings how far traveled the beam path which is indirectly related with the refractive index at different materials, the data of the thickness at each layer is treating with a geometrical analysis of the beam velocity.

Paper Details

Date Published: 24 September 2011
PDF: 8 pages
Proc. SPIE 8125, Optomechanics 2011: Innovations and Solutions, 81250M (24 September 2011); doi: 10.1117/12.894563
Show Author Affiliations
Helena S. de los Reyes-Cruz, Univ. Autónoma de Nuevo León (Mexico)
Edgar S. Arroyo-Rivera, Univ. Autónoma de Nuevo León (Mexico)
Arturo Castillo-Guzman, Univ. Autónoma de Nuevo León (Mexico)
Mario S. Lopez-Cueva, Univ. Autónoma de Nuevo León (Mexico)
Romeo Selvas, Univ. Autónoma de Nuevo León (Mexico)


Published in SPIE Proceedings Vol. 8125:
Optomechanics 2011: Innovations and Solutions
Alson E. Hatheway, Editor(s)

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