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Proceedings Paper

Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines
Author(s): Shunji Goto; Sunao Takahashi; Yuichi Inubushi; Kensuke Tono; Takahiro Sato; Makina Yabashi
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Paper Abstract

New physical-vapor-deposited (PVD) beryllium foils were characterized using coherent x-rays at the 1-km-long beamline in the SPring-8. Non-uniformity in the 150 μmx150 μm area is 3% (rms) for 0.1-nm x-rays and 5% for 0.15-nm x-rays which are almost similar value to that of previous PVD foils. The PVD beryllium foil has a capability for synchrotron radiation and x-ray free electron laser applications with spatially coherent x-rays.

Paper Details

Date Published: 28 September 2011
PDF: 7 pages
Proc. SPIE 8139, Advances in X-Ray/EUV Optics and Components VI, 813910 (28 September 2011); doi: 10.1117/12.894506
Show Author Affiliations
Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)
Sunao Takahashi, Japan Synchrotron Radiation Research Institute (Japan)
Yuichi Inubushi, RIKEN (Japan)
Kensuke Tono, Japan Synchrotron Radiation Research Institute (Japan)
Takahiro Sato, RIKEN (Japan)
Makina Yabashi, RIKEN (Japan)


Published in SPIE Proceedings Vol. 8139:
Advances in X-Ray/EUV Optics and Components VI
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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