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Proceedings Paper

Nanoparticles and metrology: a comparison of methods for the determination of particle size distributions
Author(s): Victoria A. Coleman; Åsa K. Jämting; Heather J. Catchpoole; Maitreyee Roy; Jan Herrmann
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Paper Abstract

Nanoparticles and products incorporating nanoparticles are a growing branch of nanotechnology industry. They have found a broad market, including the cosmetic, health care and energy sectors. Accurate and representative determination of particle size distributions in such products is critical at all stages of the product lifecycle, extending from quality control at point of manufacture to environmental fate at the point of disposal. Determination of particle size distributions is non-trivial, and is complicated by the fact that different techniques measure different quantities, leading to differences in the measured size distributions. In this study we use both mono- and multi-modal dispersions of nanoparticle reference materials to compare and contrast traditional and novel methods for particle size distribution determination. The methods investigated include ensemble techniques such as dynamic light scattering (DLS) and differential centrifugal sedimentation (DCS), as well as single particle techniques such as transmission electron microscopy (TEM) and microchannel resonator (ultra high-resolution mass sensor).

Paper Details

Date Published: 20 September 2011
PDF: 7 pages
Proc. SPIE 8105, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V, 810504 (20 September 2011); doi: 10.1117/12.894297
Show Author Affiliations
Victoria A. Coleman, National Measurement Institute of Australia (Australia)
Åsa K. Jämting, National Measurement Institute of Australia (Australia)
Heather J. Catchpoole, National Measurement Institute of Australia (Australia)
Maitreyee Roy, National Measurement Institute of Australia (Australia)
Jan Herrmann, National Measurement Institute of Australia (Australia)


Published in SPIE Proceedings Vol. 8105:
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
Michael T. Postek, Editor(s)

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