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Proceedings Paper

Color pattern projection method for three-dimensional measurement
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Paper Abstract

Three-dimensional measurement based on a pattern projection method has a lot of requirements such as inspections, evaluations and designings in the fields of industry. We have proposed a projection technique using a single MEMS mirror and a laser diode to realize a compact camera for three-dimensional measurement. This projection technique is able to be transformed the mechanism of the projection from time domain to spatial domain. From this technique, we achieved to develop a palm-top camera for three-dimensional profile measurement. In this paper, we propose recent improvement of the principle and its applications. We have developed three-dimensional measurement method based on a single MEMS mirror using three-color laser diodes and 3CCD camera. The measurement method has combined the merits of pattern projection method with the merits of gray code technique.

Paper Details

Date Published: 9 September 2011
PDF: 6 pages
Proc. SPIE 8133, Dimensional Optical Metrology and Inspection for Practical Applications, 81330A (9 September 2011); doi: 10.1117/12.894183
Show Author Affiliations
Toshitaka Wakayama, Saitama Medical Univ. (Japan)
Toru Yoshizawa, Saitama Medical Univ. (Japan)
NPO 3D Associates (Japan)


Published in SPIE Proceedings Vol. 8133:
Dimensional Optical Metrology and Inspection for Practical Applications
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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