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Proceedings Paper

Enhanced DIRSIG scene simulation by incorporating process models
Author(s): Jiangqin Sun; David Messinger; Michael Gartley
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Paper Abstract

The Digital Imaging and Remote Sensing Image Generation (DIRSIG) tool is a first principles-based synthetic image generation model, developed at the Rochester Institute of Technology (RIT) over the past 20+ years. By calculating the sensor reaching radiance between the bandpass 0.2 to 20μm, it produces multi or hyperspectral remote sensing images. By integrating independent first principles based sub-models, such as MODTRAN, DIRSIG generates a representation of what a sensor would see with high radiometric fidelity. Currently, DIRSIG only models spatial/spectral synthetic images. In order to detect temporal changes in a process within the scene, a process model, which links the observable signatures of interest temporally, should be developed and incorporated into DIRSIG. These process models could be external time-dependent sub-models or pre-defined process models by the users to predict the state of the objects in the scene at a specific time. In this paper, a notional system of two tanks connected by a pipe is built, with hot water coming into tank A through a second pipe and with cooled water released from tank B through a third pipe. This is a simple hydrodynamic & thermodynamic model, controlled by the state of valves in the scenario. The initial temperature and height of the water in the two tanks are pre-defined by the user. Surface temperatures as a function of time are then predicted and captured as characterization maps, which are then mapped onto DIRSIG geometry using UV mapping technique. Finally, a spatial-spectral-temporal synthetic remote sensing image is produced.

Paper Details

Date Published: 7 September 2011
PDF: 12 pages
Proc. SPIE 8158, Imaging Spectrometry XVI, 81580F (7 September 2011); doi: 10.1117/12.893956
Show Author Affiliations
Jiangqin Sun, Rochester Institute of Technology (United States)
David Messinger, Rochester Institute of Technology (United States)
Michael Gartley, Rochester Institute of Technology (United States)


Published in SPIE Proceedings Vol. 8158:
Imaging Spectrometry XVI
Sylvia S. Shen; Paul E. Lewis, Editor(s)

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