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Proceedings Paper

Solar radiation durability framework applied to acrylic solar mirrors
Author(s): Myles P. Murray; Devin Gordon; Scott A. Brown; Wei-Chun Lin; Kara A. Shell; Mark A. Schuetz; Sean Fowler; Jim Elman; Roger H. French
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Paper Abstract

Mirror augmented photovoltaic (MAPV) systems utilize low cost mirrors to couple more light into a photovoltaic (PV) absorber. By increasing the light absorbed, they are expected to produce less expensive electricity. As a substrate candidate for back surface reflector mirrors, two grades of PMMA have been exposed to UV stress from two sources at two intensities for two doses in an effort to see the response of materials under different states of stress and after exposure to different amounts of total stress. By developing a framework for correlating stresses, such as short wave ultraviolet radiation, with responses, such as induced absorbance and yellowing, mirror durability we have made progress in developing lifetime and degradation science using mirror durability as a case study. All of the samples showed similarities in their degradation characteristics. The UV stress acceleration factor was quantized as 10.2 in short wave ultraviolet irradiance, and 15.8 in total shortwave UV dose. The effects of UV absorbers in protecting the polymer from degradation are discussed. Further study into degradation mechanisms will elucidate the exact phenomena that contribute to these material responses to stress.

Paper Details

Date Published: 13 September 2011
PDF: 10 pages
Proc. SPIE 8112, Reliability of Photovoltaic Cells, Modules, Components, and Systems IV, 811203 (13 September 2011); doi: 10.1117/12.893827
Show Author Affiliations
Myles P. Murray, Case Western Reserve Univ. (United States)
Devin Gordon, Case Western Reserve Univ. (United States)
Scott A. Brown, Replex Plastics (United States)
Wei-Chun Lin, Case Western Reserve Univ. (United States)
Kara A. Shell, Case Western Reserve Univ. (United States)
Mark A. Schuetz, Replex Plastics (United States)
Sean Fowler, Q-Lab. Corp. (United States)
Jim Elman, Filmetrics Inc. (United States)
Roger H. French, Case Western Reserve Univ. (United States)

Published in SPIE Proceedings Vol. 8112:
Reliability of Photovoltaic Cells, Modules, Components, and Systems IV
Neelkanth G. Dhere; John H. Wohlgemuth; Kevin W. Lynn, Editor(s)

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