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Proceedings Paper

Undulator emission analysis: comparison between measurements and simulations
Author(s): Thierry Moreno; Edwige Otero; Xiaohao Dong; Philippe Ohresser
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Paper Abstract

The X-ray emission of the HU52 Apple2 undulator of the SOLEIL DEIMOS (Dichroism Experimental Installation for Magneto-Optical Spectroscopy) beamline is analyzed using the Bragg diffraction of a Si(111) crystal at various undulator gaps in linear horizontal polarization. Measurements are compared with simulations in order to determine undulator properties. The method allows also to get information on the electron beam.

Paper Details

Date Published: 23 September 2011
PDF: 6 pages
Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 81410H (23 September 2011); doi: 10.1117/12.893778
Show Author Affiliations
Thierry Moreno, Synchrotron SOLEIL (France)
Edwige Otero, Synchrotron SOLEIL (France)
Xiaohao Dong, Synchrotron SOLEIL (France)
Philippe Ohresser, Synchrotron SOLEIL (France)

Published in SPIE Proceedings Vol. 8141:
Advances in Computational Methods for X-Ray Optics II
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)

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