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Investigating the passivation of mercury cadmium telluride by atomic layer deposition of aluminum oxide
Author(s): James Pattison; Priyalal Wijewarnasuriya
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Paper Abstract

High aspect ratio features in mercury cadmium telluride (MCT) for advanced IR sensor technologies present a challenge to deposition of electrical passivation materials. Deposition of aluminum oxide (Al2O3) onto MCT near room temperature by plasma assisted atomic layer deposition was studied. Conformal deposition was studied through SEM images of thick (ca. 150 nm) deposition onto high aspect ratio features dry etched into MCT. Minority carrier lifetime was measured by photoconductive decay transients of MCT before and after deposition, and the lifetimes compared.

Paper Details

Date Published: 16 September 2011
PDF: 6 pages
Proc. SPIE 8155, Infrared Sensors, Devices, and Applications; and Single Photon Imaging II, 815504 (16 September 2011); doi: 10.1117/12.893760
Show Author Affiliations
James Pattison, U.S. Army Research Lab. (United States)
Priyalal Wijewarnasuriya, U.S. Army Research Lab. (United States)

Published in SPIE Proceedings Vol. 8155:
Infrared Sensors, Devices, and Applications; and Single Photon Imaging II
Manijeh Razeghi; Paul D. LeVan; Ashok K. Sood; Priyalal S. Wijewarnasuriya, Editor(s)

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