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Proceedings Paper

A toolkit for the X-ray optics simulation software package XOP/ShadowVui
Author(s): Bernd C. Meyer
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Paper Abstract

The design of a synchrotron beamline is supported by various software simulation packages containing source simulation, characterization of X-ray optics, ray-tracing simulation and others separately. Beamline designers and operators often require instantly data of the beam parameter, which is only feasible with a unified and more user-friendly software package. The new developed toolkit is a first step in that direction. Photon flux, bandwidth, beam size and beam divergence are the chosen parameters used for the beamline design and optimization. A tool was developed, which allows scanning these parameters by changing any input parameter, for example the photon energy, the vertical mirror position or the horizontal slit size. A tabular input allows scanning with arbitrary parameters or even different file names (e.g. filter material, surface profile). We present two methods of calculating power density profiles on the optical components, one by ray-tracing and the other by transmission calculation using the DABAX library. The second method only considers flat optics, but is a good approximation and faster than the method based on ray-tracing. The validation of the developed tools is shown by a comparison of the simulated beam parameters and the measured ones, which was performed at the Crystallography Beamline (MX2) recently turned into operation at the Brazilian Synchrotron Light Source (LNLS). We report also the capability of the parameterized scanning method for the alignment of the optics during the commissioning phase of the beamlines.

Paper Details

Date Published: 23 September 2011
PDF: 8 pages
Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 814114 (23 September 2011); doi: 10.1117/12.893745
Show Author Affiliations
Bernd C. Meyer, Lab. Nacional de Luz Síncrotron (Brazil)


Published in SPIE Proceedings Vol. 8141:
Advances in Computational Methods for X-Ray Optics II
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)

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