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Proceedings Paper

Coupling x-ray spectroscopy and scanning probe microscopy for simultaneous sample topography and chemical mapping
Author(s): Didier Tonneau
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Proc. SPIE 8139, Advances in X-Ray/EUV Optics and Components VI, ; doi: 10.1117/12.893744
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Didier Tonneau, Univ. de la Méditerranée (France)


Published in SPIE Proceedings Vol. 8139:
Advances in X-Ray/EUV Optics and Components VI
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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