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Proceedings Paper

A single-shot intensity-position monitor for hard x-ray FEL sources
Author(s): Yiping Feng; Jan M Feldkamp; David M. Fritz; Marco Cammarata; Robert Aymeric; Chiara Caronna; Henrik T. Lemke; Diling Zhu; Sooheyong Lee; Sebastien Boutet; Garth Williams; Kensuke Tono; Makina Yabashi; Jerome B. Hastings
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Paper Abstract

An inline diagnostics device was developed to measure the intrinsic shot-to-shot intensity and position fluctuations of the SASE-based LCLS hard X-ray FEL source. The device is based on the detection of back-scattered X-rays from a partially-transmissive thin target using a quadrant X-ray diode array. This intensity and position monitor was tested for the first time with FEL X-rays on the XPP instrument of the LCLS. Performance analyses showed that the relative precision for intensity measurements approached 0.1% and the position sensitivity was better than 5 μm, limited only by the Poisson statistics of the X-rays collected in a single shot.

Paper Details

Date Published: 5 October 2011
PDF: 6 pages
Proc. SPIE 8140, X-ray Lasers and Coherent X-ray Sources: Development and Applications IX, 81400Q (5 October 2011); doi: 10.1117/12.893740
Show Author Affiliations
Yiping Feng, SLAC National Accelerator Lab. (United States)
Jan M Feldkamp, SLAC National Accelerator Lab. (United States)
David M. Fritz, SLAC National Accelerator Lab. (United States)
Marco Cammarata, SLAC National Accelerator Lab. (United States)
Robert Aymeric, SLAC National Accelerator Lab. (United States)
Chiara Caronna, SLAC National Accelerator Lab. (United States)
Henrik T. Lemke, SLAC National Accelerator Lab. (United States)
Diling Zhu, SLAC National Accelerator Lab. (United States)
Sooheyong Lee, SLAC National Accelerator Lab. (United States)
Sebastien Boutet, SLAC National Accelerator Lab. (United States)
Garth Williams, SLAC National Accelerator Lab. (United States)
Kensuke Tono, RIKEN (Japan)
Makina Yabashi, RIKEN (Japan)
Jerome B. Hastings, SLAC National Accelerator Lab. (United States)


Published in SPIE Proceedings Vol. 8140:
X-ray Lasers and Coherent X-ray Sources: Development and Applications IX
James Dunn; Annie Klisnick, Editor(s)

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