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Proceedings Paper

Silicon pore optics for astrophysical missions
Author(s): Giuseppe Vacanti; Marcelo Ackermann; Coen van Baren; Marco W. Beijersbergen; Maximilien J. Collon; Michael Freyberg; Ramses Günther; Jeroen Haneveld; Arenda Koelewijn; Erik Maddox; Mark Olde Riekerink; Rakesh Partapsing
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Paper Abstract

The establishment of Silicon Pore Optics (SPO) as the technology of choice for the implementation of future large X-ray space optics has opened up the road to its use in all classes of X-ray missions with varying scientific goals. This interest has given us the possibility to broaden the design parameter space which is normally considered for SPO optics. In doing so a number of classical space X-ray optics design issues (e.g., field of view, stray light, baffling, aberrations) have been tackled. In this paper we report on recent results achieved in this effort. Particular attention will be given to the issues of stray light and baffling, a topic upon which a combination of analytical, simulation, and data analysis means can be effectively brought to bear. Missions considering the use of SPO optics have requirements spanning more than two orders of magnitude in energy, and a factor 20 in focal length. The possibilities that can be considered and the trade offs that must be made when applying SPO to such a wide range of optical designs will be illustrated, and some of the possible solutions discussed.

Paper Details

Date Published: 7 October 2011
PDF: 13 pages
Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 81470F (7 October 2011); doi: 10.1117/12.893598
Show Author Affiliations
Giuseppe Vacanti, cosine Science & Computing B.V. (Netherlands)
Marcelo Ackermann, cosine Research B.V. (Netherlands)
Coen van Baren, SRON Nationaal Instituut voor Ruimteonderzoek (Netherlands)
Marco W. Beijersbergen, cosine Research B.V. (Netherlands)
Maximilien J. Collon, cosine Research B.V. (Netherlands)
Michael Freyberg, Max-Planck Institut für extraterrestrische Physik (Germany)
Ramses Günther, cosine Research B.V. (Netherlands)
Jeroen Haneveld, Micronit Microfluidics B.V. (Netherlands)
Arenda Koelewijn, Micronit Microfluidics B.V. (Netherlands)
Erik Maddox, cosine Research B.V. (Netherlands)
Mark Olde Riekerink, Micronit Microfluidics B.V. (Netherlands)
Rakesh Partapsing, cosine Research B.V. (Netherlands)


Published in SPIE Proceedings Vol. 8147:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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