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Proceedings Paper

Methods for measuring work surface illuminance in adaptive solid state lighting networks
Author(s): Byungkun Lee; Matthew Aldrich; Joseph A. Paradiso
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Paper Abstract

The inherent control flexibility implied by solid-state lighting - united with the rich details offered by sensor networks - prompts us to rethink lighting control. In this research, we propose several techniques for measuring work surface illuminance and ambient light using a sensor network. The primary goal of this research is to measure work surface illuminance without distraction to the user. We discuss these techniques, including the lessons learned from our prior research. We present a new method for measuring the illuminance contribution of an arbitrary luminaire at the work surface by decomposing the modulated light into its fundamental and harmonic components.

Paper Details

Date Published: 24 September 2011
PDF: 10 pages
Proc. SPIE 8123, Eleventh International Conference on Solid State Lighting, 81230V (24 September 2011); doi: 10.1117/12.893562
Show Author Affiliations
Byungkun Lee, Massachusetts Institute of Technology (United States)
Matthew Aldrich, Massachusetts Institute of Technology (United States)
Joseph A. Paradiso, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 8123:
Eleventh International Conference on Solid State Lighting
Matthew H. Kane; Christian Wetzel; Jian-Jang Huang, Editor(s)

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