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Proceedings Paper

Pulsed terahertz bi-directional reflection distribution function (BRDF) measurements of materials and obscurants
Author(s): Shu-Zee A. Lo; Edwin J. Heilweil
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Paper Abstract

We report a pulsed method to measure reflection and scattering from several samples with different degrees of surface roughness and material properties at terahertz frequencies. Reflection from a flat gold mirror shows that the full width half maximum (FWHM) of the terahertz beam angular spread is <4° for frequency range 0.2 THz to 3 THz with signal-to-noise of 65 dB. Measurement of a paper index card, used as a low scattering sample, shows that the reflection/scattering properties are essentially similar to the system signature response except for multiple reflections between the front and back surfaces of the sample. Sixty-grit sandpaper shows multiple scattering events with almost no signal reflected from the flat backing paper surface. Corduroy cloth shows periodic reflections in the time domain, which correspond to diffraction lobes in the spectral domain.

Paper Details

Date Published: 8 September 2011
PDF: 8 pages
Proc. SPIE 8119, Terahertz Emitters, Receivers, and Applications II, 811905 (8 September 2011); doi: 10.1117/12.893520
Show Author Affiliations
Shu-Zee A. Lo, National Institute of Standards and Technology (United States)
Univ. of Maryland, College Park (United States)
Edwin J. Heilweil, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 8119:
Terahertz Emitters, Receivers, and Applications II
Manijeh Razeghi; Nicolas Péré-Laperne; Henry O. Everitt; John M. Zavada; Tariq Manzur, Editor(s)

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