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Proceedings Paper

Design, fabrication, and characterization of silicon pore optics for ATHENA/IXO
Author(s): Maximilien J. Collon; Ramses Günther; Marcelo Ackermann; Rakesh Partapsing; Giuseppe Vacanti; Marco W. Beijersbergen; Marcos Bavdaz; Kotska Wallace; Erik Wille; Mark Olde Riekerink; Jeroen Haneveld; Arenda Koelewijn; Coen van Baren; Peter Müller; Michael Krumrey; Michael Freyberg; Anders C. Jakobsen; Finn Christensen
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Paper Abstract

Silicon pore optics is a technology developed to enable future large area X-ray telescopes, such as the International X-ray Observatory (IXO) or the Advanced Telescope for High ENergy Astrophysics (ATHENA), an L-class candidate mission in the ESA Space Science Programme 'Cosmic Visions 2015-2025'. ATHENA/IXO use nested mirrors in Wolter-I configuration to focus grazing incidence X-ray photons on a detector plane. The x-ray optics will have to meet stringent performance requirements including an effective area of a few m2 at 1.25 keV and angular resolution between 5(IXO) and 9(ATHENA) arc seconds. To achieve the collecting area requires a total polished mirror surface area close to 1000 m2 with a surface roughness better than 0.5 nm rms. By using commercial high-quality 12" silicon wafers which are diced, structured, wedged, coated, bent and stacked, the stringent performance requirements can be met without any costly polishing steps. Two of such stacks are then assembled into a co-aligned mirror module, which is a complete X-ray imaging system. Included in the mirror module are the isostatic mounting points, providing a reliable interface to the telescope. Hundreds of such mirror modules are finally integrated into petals, and mounted onto the spacecraft to form an X-ray optic. In this paper we will present the silicon pore optics mass manufacturing process and latest X-ray test results.

Paper Details

Date Published: 7 October 2011
PDF: 10 pages
Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 81470D (7 October 2011); doi: 10.1117/12.893418
Show Author Affiliations
Maximilien J. Collon, cosine Research B.V. (Netherlands)
Ramses Günther, cosine Research B.V. (Netherlands)
Marcelo Ackermann, cosine Research B.V. (Netherlands)
Rakesh Partapsing, cosine Research B.V. (Netherlands)
Giuseppe Vacanti, cosine Science & Computing B.V. (Netherlands)
Marco W. Beijersbergen, cosine Research B.V. (Netherlands)
Marcos Bavdaz, European Space Agency, ESTEC (Netherlands)
Kotska Wallace, European Space Agency, ESTEC (Netherlands)
Erik Wille, European Space Agency, ESTEC (Netherlands)
Mark Olde Riekerink, European Space Agency, ESTEC (Netherlands)
Jeroen Haneveld, Micronit Microfluidics B.V. (Netherlands)
Arenda Koelewijn, Micronit Microfluidics B.V. (Netherlands)
Coen van Baren, SRON Nationaal Instituut voor Ruimteonderzoek (Netherlands)
Peter Müller, Physikalisch-Technische Bundesanstalt (Germany)
Michael Krumrey, Physikalisch-Technische Bundesanstalt (Germany)
Michael Freyberg, Max-Planck-Institut für extraterrestrische Physik (Germany)
Anders C. Jakobsen, DTU Space, Technical Univ. of Denmark (Denmark)
Finn Christensen, DTU Space, Technical Univ. of Denmark (Denmark)


Published in SPIE Proceedings Vol. 8147:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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