Share Email Print
cover

Proceedings Paper

Grazing incidence wavefront sensing and verification of x-ray optics performance
Author(s): Timo T. Saha; Scott Rohrbach; William W. Zhang; Tyler C. Evans; Melinda Hong
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Evaluation of interferometric mirror metrology data and characterization of a telescope wavefront can be powerful tools in understanding image characteristics of an x-ray optical system. In the development of soft x-ray telescope for the International X-Ray Observatory (IXO), we have developed new approaches to support the telescope development process. Interferometrically measuring the optical components over all relevant spatial frequencies can be used to evaluate and predict the performance of an x-ray telescope. Typically, the mirrors are measured using a mount that minimizes the mount and gravity induced errors. In the assembly and mounting process the shape of the mirror segments can dramatically change. We have developed wavefront sensing techniques suitable for the x-ray optical components to aid us in the characterization and evaluation of these changes. Hartmann sensing of a telescope and its components is a simple method that can be used to evaluate low order mirror surface errors and alignment errors. Phase retrieval techniques can also be used to assess and estimate the low order axial errors of the primary and secondary mirror segments. In this paper we describe the mathematical foundation of our Hartmann and phase retrieval sensing techniques. We show how these techniques can be used in the evaluation and performance prediction process of x-ray telescopes.

Paper Details

Date Published: 11 October 2011
PDF: 12 pages
Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 814717 (11 October 2011); doi: 10.1117/12.893404
Show Author Affiliations
Timo T. Saha, NASA Goddard Space Flight Ctr. (United States)
Scott Rohrbach, NASA Goddard Space Flight Ctr. (United States)
William W. Zhang, NASA Goddard Space Flight Ctr. (United States)
Tyler C. Evans, SGT, Inc (United States)
Melinda Hong, SGT, Inc (United States)


Published in SPIE Proceedings Vol. 8147:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

© SPIE. Terms of Use
Back to Top