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Proceedings Paper

Measuring the residual stress of transparent conductive oxide films on PET by the double-beam shadow Moiré interferometer
Author(s): Hsi-Chao Chen; Kuo-Ting Huang; Yen-Ming Lo; Hsuan-Yi Chiu; Guan-Jhen Chen
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Paper Abstract

The purpose of this research was to construct a measurement system which can fast and accurately analyze the residual stress of the flexible electronics. The transparent conductive oxide (TCO) films, tin-doped indium oxide (ITO), were deposited by radio frequency (RF) magnetron sputtering using corresponding oxide targets on PET substrate. As we know that the shadow Moiré interferometry is a useable way to measure the large deformation. So we set up a double beam shadow Moiré interferometer to measure and analyze the residual stress of TCO films on PET. The feature was to develop a mathematical model and combine the image processing software. By the LabVIEW graphical software, we could measure the distance which is between the left and right fringe on the pattern to solve the curvature of deformed surface. Hence, the residual stress could calculate by the Stoney correction formula for the flexible electronics. By combining phase shifting method with shadow Moiré, the measurement resolution and accuracy have been greatly improved. We also had done the error analysis for the system whose relative error could be about 2%. Therefore, shadow Moiré interferometer is a non-destructive, fast, and simple system for the residual stress on TCO/PET films.

Paper Details

Date Published: 27 September 2011
PDF: 8 pages
Proc. SPIE 8126, Optical Manufacturing and Testing IX, 81260C (27 September 2011); doi: 10.1117/12.893310
Show Author Affiliations
Hsi-Chao Chen, National Yunlin Univ. of Science and Technology (Taiwan)
Kuo-Ting Huang, National Yunlin Univ. of Science and Technology (Taiwan)
Yen-Ming Lo, National Yunlin Univ. of Science and Technology (Taiwan)
Hsuan-Yi Chiu, National Yunlin Univ. of Science and Technology (Taiwan)
Guan-Jhen Chen, National Yunlin Univ. of Science and Technology (Taiwan)


Published in SPIE Proceedings Vol. 8126:
Optical Manufacturing and Testing IX
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)

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