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Proceedings Paper

Mcps-range photon-counting x-ray computed tomography system
Author(s): Eiichi Sato; Yasuyuki Oda; Abulajiang Abudurexiti; Osahiko Hagiwara; Toshiyuki Enomoto; Shigeaki Sugimura; Haruyuki Endo; Shigehiro Sato; Akira Ogawa; Jun Onagawa
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Paper Abstract

10 Mcps photon counting was carried out using a detector consisting of a 2.0 mm-thick ZnO (zinc oxide) single-crystal scintillator and an MPPC (multipixel photon counter) module in an X-ray computed tomography (CT) system. The maximum count rate was 10 Mcps (mega counts per second) at a tube voltage of 70 kV and a tube current of 2.0 mA. Next, a photon-counting X-ray CT system consists of an X-ray generator, a turntable, a scan stage, a two-stage controller, the ZnO-MPPC detector, a counter card (CC), and a personal computer (PC). Tomography is accomplished by repeated linear scans and rotations of an object, and projection curves of the object are obtained by the linear scan with a scan velocity of 25 mm/s. The pulses of the event signal from the module are counted by the CC in conjunction with the PC. The exposure time for obtaining a tomogram was 600 s at a scan step of 0.5 mm and a rotation step of 1.0°, and photon-counting CT was accomplished using iodine-based contrast media.

Paper Details

Date Published: 15 September 2011
PDF: 5 pages
Proc. SPIE 8143, Medical Applications of Radiation Detectors, 81430K (15 September 2011); doi: 10.1117/12.893219
Show Author Affiliations
Eiichi Sato, Iwate Medical Univ. (Japan)
Yasuyuki Oda, Iwate Medical Univ. (Japan)
Abulajiang Abudurexiti, Toreck, Inc. (Japan)
Osahiko Hagiwara, The Toho Univ. (Japan)
Toshiyuki Enomoto, The Toho Univ. (Japan)
Shigeaki Sugimura, Tokyo Denpa Co. Ltd. (Japan)
Haruyuki Endo, Iwate Industrial Research Institute (Japan)
Shigehiro Sato, Iwate Medical Univ. (Japan)
Akira Ogawa, Iwate Medical Univ. (Japan)
Jun Onagawa, Tohoku Gakuin Univ. (Japan)


Published in SPIE Proceedings Vol. 8143:
Medical Applications of Radiation Detectors
H. Bradford Barber; Hans Roehrig; Douglas J. Wagenaar, Editor(s)

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