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Proceedings Paper

Lumen degradation and chromaticity shift in glass and silicone based high-power phosphor-converted white-emitting diodes under thermal tests
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Paper Abstract

The lumen degradation and chromaticity shift in glass and silicone based high-power phosphor-converted white-emitting diodes (PC-WLEDs) under accelerated thermal tests at 150°C, 200°C, and 250°C are presented and compared. The glass based PC-WLEDs exhibited better thermal stability than the silicone by 4.8 time reductions in lumen loss 6.8 time reductions in chromaticity shift at 250°C, respectively. The mean-time-to-failure (MTTF) evaluation of glass and silicone based high-power PC-WLEDs in accelerated thermal tests is also presented and compared. The results showed that the glass based PC-WLEDs exhibited higher MTTF than the silicone by 7.53 times in lumen loss and 14.4 times in chromaticity shift at 250°C, respectively. The thermal performance of lumen, chromaticity, and MTTF investigations demonstrated that the thermal stability of the glass based PC-WLEDs were better than the silicone. A better thermal stability phosphor layer of glass as encapsulation material may be beneficial to the many applications where the LED modules with high power and high reliability are demanded.

Paper Details

Date Published: 22 September 2011
PDF: 7 pages
Proc. SPIE 8123, Eleventh International Conference on Solid State Lighting, 81230F (22 September 2011); doi: 10.1117/12.892546
Show Author Affiliations
Wood-Hi Cheng, National Sun Yat-Sen Univ. (Taiwan)
Chun-Chin Tsai, Far East Univ. (Taiwan)
Jimmy Wang, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 8123:
Eleventh International Conference on Solid State Lighting
Matthew H. Kane; Christian Wetzel; Jian-Jang Huang, Editor(s)

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