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Proceedings Paper

Mirror segments for large mirror systems of weak optical signals detectors for UV spectral range
Author(s): P. Schovanek; M. Hrabovsky; M. Palatka; M. Pech; D. Mandat; L. Nozka; A. Dejneka; J. Jankuj; M. Vujtek
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Paper Abstract

Authors introduce several results of high quality mirror segments testing. The segments were designed for the large-area light-weight mirror systems for UV detectors of weak optical signals. For this category of the optical components, an increasing of demands on technology production is typical. This is caused by various reasons: 1) Thickness to diameter ratio is 1:100 for this type of segments. For astronomical mirrors, this ratio is about 1:10. This is the reason why the manufacturing technology of the light-weight segment surfaces was changed. Similarly, usually used testing methods of the shape of the optical surfaces are changed. The shapes of the surfaces are evaluated by the minimal spot diameter of the reflected beam, which contains 95% of the incident light; 2) Processing technology of working surfaces was enhanced because of the UV light wavelength. The technology must respect the fact that the amount of diffused light in the short UV wavelength region is increasing in the dependence on the surface roughness of the mirror; 3) Surface reflectivity is not the only important parameter of the optical reflecting thin film systems in this kind of applications. Surface roughness and homogeneity of thin films are taken into account of testing methods too.

Paper Details

Date Published: 27 September 2011
PDF: 11 pages
Proc. SPIE 8126, Optical Manufacturing and Testing IX, 812619 (27 September 2011); doi: 10.1117/12.892338
Show Author Affiliations
P. Schovanek, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
M. Hrabovsky, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
M. Palatka, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
M. Pech, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
D. Mandat, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
L. Nozka, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
A. Dejneka, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
J. Jankuj, Meopta - optika, s.r.o. (Czech Republic)
M. Vujtek, Palacky Univ. Olomouc (Czech Republic)


Published in SPIE Proceedings Vol. 8126:
Optical Manufacturing and Testing IX
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)

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